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US Patent Issued to Ushio Denki on Aug. 25 for "Tablet spectroscopic measurement method" (Japanese Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,851, issued on Aug. 25, was assigned to Ushio Denki K.K. (Tokyo). "Tablet spectroscopic measurement method" was invented by Aya Ota (Tokyo)... Read More


US Patent Issued to Tata Consultancy Services on Aug. 25 for "Non-contact method and system for inspection and detection of water saturated regions in rockmass" (Indian Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,852, issued on Aug. 25, was assigned to Tata Consultancy Services Ltd. (Mumbai, India). "Non-contact method and system for inspection and d... Read More


US Patent Issued to ISHIDA on Aug. 25 for "X-ray inspection apparatus" (Japanese Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,853, issued on Aug. 25, was assigned to ISHIDA Co. LTD. (Kyoto, Japan). "X-ray inspection apparatus" was invented by Futoshi Yurugi (Ritto,... Read More


US Patent Issued to Applied Materials on Aug. 25 for "Determining tilt angle of substrate structures utilizing angular fourier decomposition of scattering images" (California, Michigan Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,854, issued on Aug. 25, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "Determining tilt angle of substrate structures utili... Read More


US Patent Issued to XENOCS on Aug. 25 for "X-ray scattering apparatus and x-ray scattering method" (French Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,855, issued on Aug. 25, was assigned to XENOCS SAS (Grenoble, France). "X-ray scattering apparatus and x-ray scattering method" was invente... Read More


US Patent Issued to Infineon Technologies on Aug. 25 for "Method and device for monitoring thermal impedance" (German Inventor)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,856, issued on Aug. 25, was assigned to Infineon Technologies AG (Neubiberg, Germany). "Method and device for monitoring thermal impedance"... Read More


US Patent Issued to NGK INSULATORS on Aug. 25 for "Method of measuring a conductivity of a liquid using a conductivity sensor" (Japanese Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,857, issued on Aug. 25, was assigned to NGK INSULATORS Ltd. (Nagoya, Japan). "Method of measuring a conductivity of a liquid using a conduc... Read More


US Patent Issued to PERIDOT PRINT on Aug. 25 for "Three-dimensional printed sensors" (California Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,858, issued on Aug. 25, was assigned to PERIDOT PRINT LLC (Palo Alto, Calif.). "Three-dimensional printed sensors" was invented by Jarrid W... Read More


US Patent Issued to SUNNYBROOK RESEARCH INSTITUTE on Aug. 25 for "Electrochemical immuno-biosensor and method for detection of circulating protein biomarkers" (Canadian Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,859, issued on Aug. 25, was assigned to SUNNYBROOK RESEARCH INSTITUTE (Toronto). "Electrochemical immuno-biosensor and method for detection... Read More


US Patent Issued to The Regents of the University of California on Aug. 25 for "Printed potentiometric sensors to measure ion concentration in soil" (California Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,860, issued on Aug. 25, was assigned to The Regents of the University of California (Oakland, Calif.). "Printed potentiometric sensors to m... Read More